Hybrid near- and far-field three-stage beam training with beam split for RIS-assisted OFDM communications

Zhichao CHENG , Shupei ZHANG , Shu FU , Boya DI

Front. Inform. Technol. Electron. Eng ›› 2024, Vol. 25 ›› Issue (12) : 1664 -1678.

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Front. Inform. Technol. Electron. Eng ›› 2024, Vol. 25 ›› Issue (12) : 1664 -1678. DOI: 10.1631/FITEE.2400372

Hybrid near- and far-field three-stage beam training with beam split for RIS-assisted OFDM communications

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Abstract

With the development of millimeter-wave (mmWave) communication systems, large-scale reconfigurable intelligent surfaces (RISs) have gained considerable attention as a promising technology for signal strength enhancement and coverage extension. However, as the antenna scale and bandwidth increase, RIS-assisted wideband orthogonal frequency division multiplexing (OFDM) communication systems face challenges due to the near-field range expansion and the beam split effect over the high-frequency band, complicating the acquisition of channel state information (CSI). To tackle these challenges, we present a codebook-based three-stage beam training scheme by using the beam split effect to bypass CSI estimation. Specifically, by analyzing the beam split effect in RIS-assisted OFDM communication systems, we propose a beam-split-aware codebook capable of covering both the near and far fields with fewer codewords compared to conventional narrow-band codebooks. Using such a codebook, a three-stage beam training mechanism is adopted to obtain the optimal codeword with low time overhead, thereby facilitating subsequent beamforming. Simulation results demonstrate that the proposed scheme outperforms existing near- and far-field codebook-based schemes in terms of the beam training resolution and sum rate in the hybrid near-far field.

Keywords

Near-far field / Beam split / Codebook design / Beam training / Reconfigurable intelligent surfaces

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Zhichao CHENG, Shupei ZHANG, Shu FU, Boya DI. Hybrid near- and far-field three-stage beam training with beam split for RIS-assisted OFDM communications. Front. Inform. Technol. Electron. Eng, 2024, 25(12): 1664-1678 DOI:10.1631/FITEE.2400372

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