Displacement measuring grating interferometer: a review

Peng-cheng HU , Di CHANG , Jiu-bin TAN , Rui-tao YANG , Hong-xing YANG , Hai-jin FU

Front. Inform. Technol. Electron. Eng ›› 2019, Vol. 20 ›› Issue (5) : 631 -654.

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Front. Inform. Technol. Electron. Eng ›› 2019, Vol. 20 ›› Issue (5) : 631 -654. DOI: 10.1631/FITEE.1800708
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Displacement measuring grating interferometer: a review

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Abstract

A grating interferometer, called the “optical encoder,” is a commonly used tool for precise displacement measurements. In contrast to a laser interferometer, a grating interferometer is insensitive to the air refractive index and can be easily applied to multi-degree-of-freedom measurements, which has made it an extensively researched and widely used device. Classified based on the measuring principle and optical configuration, a grating interferometer experiences three distinct stages of development: homodyne, heterodyne, and spatially separated heterodyne. Compared with the former two, the spatially separated heterodyne grating interferometer could achieve a better resolution with a feature of eliminating periodic nonlinear errors. Meanwhile, numerous structures of grating interferometers with a high optical fold factor, a large measurement range, good usability, and multidegree-of-freedom measurements have been investigated. The development of incremental displacement measuring grating interferometers achieved in recent years is summarized in detail, and studies on error analysis of a grating interferometer are briefly introduced.

Keywords

Grating interferometer / Optical encoder / Displacement measurement / Precision measurement

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Peng-cheng HU, Di CHANG, Jiu-bin TAN, Rui-tao YANG, Hong-xing YANG, Hai-jin FU. Displacement measuring grating interferometer: a review. Front. Inform. Technol. Electron. Eng, 2019, 20(5): 631-654 DOI:10.1631/FITEE.1800708

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