Versionized process based on non-volatile random-access memory for fine-grained fault tolerance

Wen-zhe ZHANG , Kai LU , Xiao-ping WANG

Front. Inform. Technol. Electron. Eng ›› 2018, Vol. 19 ›› Issue (2) : 192 -205.

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Front. Inform. Technol. Electron. Eng ›› 2018, Vol. 19 ›› Issue (2) : 192 -205. DOI: 10.1631/FITEE.1601477
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Versionized process based on non-volatile random-access memory for fine-grained fault tolerance

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Abstract

Non-volatile random-access memory (NVRAM) technology is maturing rapidly and its byte-persistence feature allows the design of new and efficient fault tolerance mechanisms. In this paper we propose the versionized process (VerP), a new process model based on NVRAM that is natively non-volatile and fault tolerant. We introduce an intermediate software layer that allows us to run a process directly on NVRAM and to put all the process states into NVRAM, and then propose a mechanism to versionize all the process data. Each piece of the process data is given a special version number, which increases with the modification of that piece of data. The version number can effectively help us trace the modification of any data and recover it to a consistent state after a system crash. Compared with traditional checkpoint methods, our work can achieve fine-grained fault tolerance at very little cost.

Keywords

Non-volatile memory / Byte-persistence / Versionized process / Version number

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Wen-zhe ZHANG, Kai LU, Xiao-ping WANG. Versionized process based on non-volatile random-access memory for fine-grained fault tolerance. Front. Inform. Technol. Electron. Eng, 2018, 19(2): 192-205 DOI:10.1631/FITEE.1601477

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