利用对称结构和结合差分进化的文化算法检测阵列中的故障传感器

Abstract

本文解决了从N个传感器组成的线性阵列中检测完全或部分缺陷传感器的问题。本文首先提出了一种线性阵列的对称结构，其次，基于结合差分进化的文化算法，建立了一种混合技术。对称结构具有两个优点：(1)不需要找到所有损坏的模式，仅需找到(N–1)/2个必需模式；(2)不需要扫描0°到180°区域，仅需扫描0°到90°区域。显然，这样可以减少计算的复杂度。通过Monte Carlo模拟对该方案性能进行了验证，并在计算时间和均方误差方面与现有方法进行了比较。

Keywords

文化算法 / 差分进化 / 线性对称传感器阵列

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Zhejiang University and Springer-Verlag Berlin Heidelberg