Triphenylmethane-Derived Levelers for High-Speed Redistribution Layer Copper Electroplating of Tailored Surface Morphologies

Zi-Hao Song , Wei-Bin Wang , Xiao-Hui Liu , Xiao-Min Han , Yi Zhou , Rui Huang , Yan-Xia Jiang , Zhe Li , Xiao-Wei Liu , Mei-Ling Xiao , Hong-Gang Liao , Wei-Lin Xu , Rong Sun

Journal of Electrochemistry ›› 2026, Vol. 32 ›› Issue (2) : 2509091

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Journal of Electrochemistry ›› 2026, Vol. 32 ›› Issue (2) :2509091 DOI: 10.61558/2993-074X.3591
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Triphenylmethane-Derived Levelers for High-Speed Redistribution Layer Copper Electroplating of Tailored Surface Morphologies
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Abstract

Redistribution Layer (RDL), composed of layered dielectrics and electroplated copper materials, is a basic structure to rearrange numerous I/O pads on the chip surface in wafer-level advanced packaging. As the key chemicals in electrolyte baths, electroplating additives have undergone continuous development to meet the industrial needs for high-speed and fine-line/fine-pitch applications. Meanwhile, the intricate relationships between additive chemical structures and electroplated copper properties are yet to be well understood. In this work, a pair of triphenylmethane-based dye molecules, i.e., gentian violet (GV) and methyl green (MG), was comparatively investigated as levelers for high-speed RDL copper electroplating. Compared to GV, significantly stronger electrochemical polarization and tunable deposit morphology can be achieved by MG with just one extra quaternized amine terminal. Combining quantum chemical computations, in situ spectroelectrochemical analyses, and microstructural characterization, it is found that MG possesses enhanced electrostatic adsorption, surface coverage and multi-additive synergies, enabling tailored copper trace morphology. This study elaborates the adsorption mechanism and screening criteria of triphenylmethane-derived levelers, and presents a candidate additive structure for high-speed copper electroplating.

Keywords

Redistribution layer / Copper electroplating leveler / Theoretical computation / In situ spectroelectrochemical analysis / Microstructural characterization

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Zi-Hao Song, Wei-Bin Wang, Xiao-Hui Liu, Xiao-Min Han, Yi Zhou, Rui Huang, Yan-Xia Jiang, Zhe Li, Xiao-Wei Liu, Mei-Ling Xiao, Hong-Gang Liao, Wei-Lin Xu, Rong Sun. Triphenylmethane-Derived Levelers for High-Speed Redistribution Layer Copper Electroplating of Tailored Surface Morphologies. Journal of Electrochemistry, 2026, 32(2): 2509091 DOI:10.61558/2993-074X.3591

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Acknowledgements

This work was financially supported by National Natural Science Foundation of China (Grant Nos. 62304143, 22425204, 22288102 and 22472143), Natural Science Foundation of Xiamen, China (Grant No. 20241302), and the autonomous deployment project of State Key Laboratory of Materials for Integrated Circuits (No. SKLJC-Z2024-C03).

Conflict of Interests

We wish to confirm that there are no known conflicts of interest associated with this publication and there has been no significant financial support for this work that could have influenced its outcome.

Author Contributions

Zi-Hao Song: Methodology, Validation, Formal analysis, Investigation, Data curation, Writing- Original Draft. Wei-Bin Wang: Methodology, Validation, Formal analysis, Investigation, Data curation, Writing- Original Draft. Xiao-Hui Liu: Validation, Investigation, Formal analysis. Xiao-Min Han: Validation, Investigation, Formal analysis. Yi Zhou: Validation, Formal analysis. Rui Huang: Validation, Formal analysis. Yan-Xia Jiang: Validation, Formal analysis. Zhe Li: Conceptualization, Methodology, Formal analysis, Investigation, Writing- Original Draft, Writing- Review & Editing, Supervision, Project Administration, Funding acquisition. Xiao-Wei Liu: Methodology, Formal analysis, Supervision. Meiling Xiao: Methodology, Formal analysis, Investigation, Supervision. Hong-Gang Liao: Methodology, Formal analysis, Investigation, Supervision, Funding acquisition. Wei-Lin Xu: Project Administration, Funding acquisition. Rong Sun: Project Administration, Funding acquisition.

Data Availability

The datasets generated during and/or analyzed during the current study are available from the corresponding authors on reasonable request.

References

[1]

Moffat T P, Braun T M, Raciti D, Josell D. Superconformal film growth: from smoothing surfaces to interconnect technology[J]. Acc. Chem. Res., 2023, 56(9): 1004-1017. https://doi.org/10.1021/acs.accounts.2c00840.

[2]

Ho S W, Soh S B, Lau B L, Hsiao H Y, Lim S P S, Vempati S R. Development of large RDL interposer package:RDL-first FOWLP and 2.5 D FO-interposer[C]//2024 IEEE 26th Electronics Packaging Technology Conference (EPTC). IEEE, 2024: 72-77. https://doi.org/10.1109/EPTC62800.2024.10909681.

[3]

Hsu W Y, Tseng I H, Chiang C Y, Tu K N, Chen C. Distribution of elastic stress as a function of temperature in a 2-μm redistribution line of Cu measured with X-ray nanodiffraction analysis[J]. J. Mater. Res. Technol., 2022, 20: 2799-2808. https://doi.org/10.1016/j.jmrt.2022.08.049.

[4]

Wang C, Peng C, Xiang J, Chen Y M, He W, Su X H, Luo Y Y. Research and application of copper electroplating in interconnection of printed circuit board[J]. J. Electrochem, 2021, 27(3): 257-268. https://doi.org/10.13208/j.electrochem.201255.

[5]

Wang F L, Li Y J, He H, Wang Y, Zhu W H, Li J P. Effect of Bis-(3-sulfopropyl) disulfide and chloride ions on the localized electrochemical deposition of copper microstructures[J]. J. Electrochem. Soc., 2017, 164(7): D419. https://doi.org/10.1149/2.0781707jes.

[6]

Bandas C D, Rooney R T, Kirbs A, Jäger C, Schmidt R, Gewirth A A. Interfacial leveler-accelerator interactions in Cu electrodeposition[J]. J. Electrochem. Soc., 2021, 168(4): 042501. https://doi.org/10.1149/1945-7111/abee5d.

[7]

Wu Y C, Mao Z J, Jiang T W, Ma X Y, Zheng L, Jiang K, Cai W B. Revisiting the polyethylene glycol-chloride adsorption structure on Cu electrode in sulfuric acid solution by wide-frequency ATR-SEIRAS[J]. J. Phys. Chem. C, 2023, 127(44): 21695-21703. https://doi.org/10.1021/acs.jpcc.3c04286.

[8]

Gallaway J W, Willey M J, West A C. Acceleration kinetics of PEG, PPG, and a triblock copolymer by SPS during copper electroplating[J]. J. Electrochem. Soc., 2009, 156(4): D146. https://doi.org/10.1021/10.1149/1.3078405.

[9]

Schmitt K G, Schmidt R, Gaida J, Gewirth A A. Chain length variation to probe the mechanism of accelerator additives in copper electrodeposition[J]. Phys. Chem. Chem. Phys., 2019, 21(30): 16838-16847. https://doi.org/10.1039/C9CP00839J.

[10]

Wang Y H, Duraisamy S R, Tsai D H. Quantifying thiolated chemical additives for copper electroplating process[J]. Anal. Chim. Acta, 2024, 1307: 342608. https://doi.org/10.1016/j.aca.2024.342608.

[11]

Peng Z J, Li Z, Jiao Y, Zhang N, Zhang Q, Zhou B, Zhou B B, Gao L Y, Fu X Z, Liu Z Q, Sun R. Manipulating adsorbate configurations in copper electroplated low aspect-ratio via fill in redistribution layers[J]. Nano Mater. Sci., 2024, 7(4): 500-510. https://doi.org/10.1016/j.nanoms.2024.07.001.

[12]

Li X Y, Yin X P, Li J, Yuan B, Wang C Y, Zou P K, Wang L M. Synthesis of coplanar quaternary ammonium salts with excellent electrochemical properties based on an anthraquinone skeleton and their application in copper plating[J]. Electrochim. Acta, 2023, 437: 141541. https://doi.org/10.1016/j.electacta.2022.141541.

[13]

Yuan B, Chen X, Zhao Y L, Zhou W H, Li X Y, Wang L M. Unveiling the potential and mechanisms of 3,3′-bicarbazole-based quaternary ammonium salts as levelers[J]. Electrochim. Acta, 2023, 471: 143345. https://doi.org/10.1016/j.electacta.2023.143345.

[14]

Meng Y C, Zhou M M, Huang W, Min Y L, Shen X, Xu Q J. Benzyl-containing quaternary ammonium salt as a new leveler for microvia copper electroplating[J]. Electrochim. Acta, 2022, 429: 141013. https://doi.org/10.1016/j.electacta.2022.141013.

[15]

Zhou M M, Meng Y C, Ling W, Zhang Y, Huang W, Min Y L, Shen X, Xu Q J. 5-Amino-1,3,4-thiadiazole-2-thiol as a new leveler for blind holes copper electroplating: Theoretical calculation and electrochemical studies[J]. Appl. Surf. Sci., 2022, 606: 154871. https://doi.org/10.1016/j.electacta.2022.141013.

[16]

Li Y Q, Ren P H, Zhang Y H, Wang S X, Zhang J Q, Yang P X, Liu A M, Wang G Z, Chen Z D, An M Z. The influence of leveler Brilliant Green on copper superconformal electroplating based on electrochemical and theoretical study[J]. J. Ind. Eng. Chem., 2023, 118: 78-90. https://doi.org/10.1016/j.jiec.2022.10.047.

[17]

Li L, Wang Z Y, Cai Z Y, Yang J Q, Zheng A N, Yang F Z, Zhan D. 1-(2-Pyridylazo)-2-naphthol as a synergistic additive for improving throwing power of through hole copper electronic electroplating[J]. J. Ind. Eng. Chem., 2023, 125: 269-276. https://doi.org/10.1016/j.jiec.2023.05.036.

[18]

Wang Z Y, Yu D, Li L, Yang J Q, Zhan D, Yang F Z, Sun S G. Studies of polixetonium chloride as a novel, hypotoxic and single additive of copper electronic plating for microvia void-free filling in printed circuit board application[J]. J. Manuf. Process., 2024, 121: 475-484. https://doi.org/10.1016/j.jmapro.2024.05.041.

[19]

Chen Z M, Li Z, Liu C, Zhan A D, Luo J Y, Shi D. Pentaerythritol-based compound as a novel leveler for super-conformal copper electroplating[J]. J. Electrochem. Soc., 2024, 171(10): 102502. https://doi.org/10.1149/1945-7111/ad7e53.

[20]

Guo L F, Li S P, He Z B, Fu Y M, Qiu F C, Liu R L, Yang G Z. Electroplated copper additives for advanced packaging: a review[J]. ACS Omega, 2024, 9(19): 20637-20647. https://doi.org/10.1021/acsomega.4c01707.

[21]

Kim T H, Baek J H, Kim S I, Kim T H, Shim J H, Kim H S. Effect of electroplating current density and post-annealing on the warpage and reliability of redistribution layer for advanced semiconductor package[J]. Mater. Des., 2025: 114732. https://doi.org/10.1016/j.matdes.2025.114732.

[22]

Park S, Koo D, Choi Y, Park J, So H. Effects of electrolyte flow direction on height difference in electroplated Cu microstructures for fine-pitch RDL[J]. J. Mater. Res. Technol., 2024, 33: 8887-8894. https://doi.org/10.1016/j.jmrt.2024.11.178.

[23]

Wang Q, Su P F, Lei Z Y, Chen M X, Luo X B. Toward ultra-high-rate copper pattern electroplating with simultaneously improved coating properties via simulations and experiments[J]. J. Manuf. Process., 2024, 131: 369-381. https://doi.org/10.1016/j.jmapro.2024.09.034.

[24]

Lee P T, Chang C H, Lee C Y, Wu Y S, Yang C H, Ho C E. High-speed electrodeposition for Cu pillar fabrication and Cu pillar adhesion to an Ajinomoto build-up film (ABF)[J]. Mater. Des., 2021, 206: 109830. https://doi.org/10.1016/j.matdes.2021.109830.

[25]

Lee P T, Wu Y S, Lee C Y, Liu H C, Ho C E. High-speed Cu electrodeposition and reliability of Cu pillar bumps in high-temperature storage[J]. J. Electrochem. Soc., 2018, 165(13): D647. https://doi.org/10.1149/2.1001813jes.

[26]

Wang Z Y, Jin L, Li G, Yang J Q, Li W Q, Zhan D P, Jiang Y X, Yang F Z, Sun S G. Electrochemical and in situ FTIR spectroscopic studies of gentian violet as a novel leveler in through-holes metallization for printed circuit board applications[J]. Electrochim. Acta, 2022, 410: 140018. https://doi.org/10.1016/j.electacta.2022.140018.

[27]

Li Y Q, Li C Z, Li R P, Peng X S, Zhang J Q, Yang P X, Wang G Z, Wang B, Broekmann P, An M Z Experimental and theoretical study of the new leveler basic blue 1 during copper superconformal growth[J]. ACS Appl. Mater. Interfaces, 2023, 15(40): 47628-47639. https://doi.org/10.1021/acsami.3c06567.

[28]

Li Y Q, Peng X S, Li R P, Jiang J, Meng F, Wu Y Z, Cao C S, Wang G Z, Ren P H, Xu H, An M Z. Insights into the role of basic Blue 7 as a Leveler in copper superfilling within microvias[J]. New J. Chem., 2025, 49(28): 12079-12089. https://doi.org/10.1039/D5NJ02092A.

[29]

Li M J, Peng X S, Jiang J, Li Y Q, Meng F, Wu Y Z, An M Z, Li R P, Ren P H, Yang P X. Filling performance of an Acid Blue 1 leveler on blind microvias[J]. New J. Chem., 2025, 49: 4538-4546. https://doi.org/10.1039/D4NJ05470A.

[30]

Li Z, Tan B, Luo J Y, Qin J F, Yang G N, Cui C, Pan L. Structural influence of nitrogen-containing groups on triphenylmethane-based levelers in super-conformal copper electroplating[J]. Electrochim. Acta, 2022, 401: 139445. https://doi.org/10.1016/j.electacta.2021.139445.

[31]

Luo J Y, Li Z, Tan B Z, Cui C Q, Shi M H, Hao Z F. Communication-triphenylmethane-based leveler for microvia filling in copper super-conformal electroplating[J]. J. Electrochem. Soc., 2019, 166(13): D603 https://doi.org/10.1149/2.0531913jes.

[32]

Dow W P, Yen M Y, Liu C W, Huang C C. Enhancement of filling Performance of a copper plating formula at low chloride concentration[J]. Electrochim. Acta, 2008, 53(10): 3610-3619. https://doi.org/10.1016/j.electacta.2007.12.048.

[33]

Dow W P, Li C C, Su Y C, Shen S P, Huang C C, Lee C, Hsu B, Hsu S. Microvia filling by copper electroplating using diazine black as a leveler[J]. Electrochim. Acta, 2009, 54(24): 5894-5901. https://doi.org/10.1016/j.electacta.2009.05.053.

[34]

Rieppo L, Saarakkala S, Närhi T, Helminen H J, Jurvelin J S, Rieppo J. Application of second derivative spectroscopy for increasing molecular specificity of fourier transform infrared spectroscopic imaging of articular cartilage[J]. Osteoarthr. Cartil., 2012, 20(5): 451-459. https://doi.org/10.1016/j.joca.2012.01.010.

[35]

Liu G K, Zou S Z, Josell D, Richter L J, Moffat T P. SEIRAS study of chloride-mediated polyether adsorption on Cu[J]. J. Phys. Chem. C, 2018, 122(38): 21933-21951. https://doi.org/10.1021/acs.jpcc.8b06644.

[36]

Li Z, He W, Zhu K, Wang C, Wang S X, Hong Y, Chen Y M, Zhou G Y, Miao H, Zhou J Q. Investigation of poly (1-vinyl imidazole co 1, 4-butanediol diglycidyl ether) as a leveler for copper electroplating of through-hole[J]. Electrochim. Acta, 2018, 283: 560-567. https://doi.org/10.1016/j.electacta.2018.06.132.

[37]

Xu J Y, Wang S X, Su Y Z, Du Y J, Qi G D, He W, Zhou G Y, Zhang W H, Tang Y, Luo Y Y, Chen Y M. Investigation of through-hole copper electroplating with methyl orange as a special leveler[J]. J. Electrochem., 2022, 28(7): 2213003. https://doi.org/10.13208/j.electrochem.2213003.

[38]

Kim S, Yu J. Recrystallization-induced void migration in electroplated Cu films[J]. Scr. Mater., 2012, 67(4): 312-315. https://doi.org/10.1016/j.scriptamat.2012.04.035.

[39]

Dong Y Z, Jiang B Y, Qiang J, Ma Z G, Drummer D, Zhang L. Tuning formation process of void defects in microcolumn arrays via pulse reverse electrodeposition[J]. J. Mater. Res. Technol., 2023, 24: 3055-3066. https://doi.org/10.1016/j.jmrt.2023.03.201.

[40]

Zhu C S, Ning W G, Li H, Zheng T, Xu G W, Luo L. Void control during plating process and thermal annealing of through-mask electroplated copper interconnects[J]. Microelectron. Relia. B., 2014, 54(4): 773-777. https://doi.org/10.1016/j.microrel.2013.12.019.

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