Pulse Electroplating of Nanotwinned Copper Using MPS-PEG Two-Additive System for Damascene via Filling Process

Yu-Xi Wang , Li-Yin Gao , Yong-Qiang Wan , Zhe Li , Zhi-Quan Liu

Journal of Electrochemistry ›› 2023, Vol. 29 ›› Issue (8) : 2209231

PDF (3782KB)
Journal of Electrochemistry ›› 2023, Vol. 29 ›› Issue (8) :2209231 DOI: 10.13208/j.electrochem.2209231
ARTICLE
research-article

Pulse Electroplating of Nanotwinned Copper Using MPS-PEG Two-Additive System for Damascene via Filling Process

Author information +
History +
PDF (3782KB)

Abstract

High density nanotwinned copper films were pulse electroplated using an optimized electrolyte. In order to find out the influencing factors on the formation of nanotwins, series contents of MPS were added to the electrolyte during the pulse electroplating process. It was found that the copper films electroplated without MPS had large grains but a few nanotwins. And the grain size was about 0.9 μm on average, and the texture components of (110) and (111) crystal orientations were calculated as 49% and 27.8%, respectively. Differently, when 10 ppm MPS was added, the microstructure was changed to columnar grain with high density of horizontal nanotwins and the crystal orientation was also changed to highly (111) orientated one. However, when the MPS content was continuously increased from 10 ppm to 40 ppm, the microstructure and crystal orientation were almost unchanged as detected by the secondary ion microscopy of focus ion beam and X ray diffraction. Specifically, when 40 ppm MPS was used, the average grain size was 0.6 μm, and the texture components of (110) and (111) crystal orientations were 3.45% and 95.1%, respectively. It demonstrated that the nanotwinned copper can be electroplated at a large concentration range of MPS, which also meant that the filling ability of nanotwinned copper electrolyte could be adjusted by MPS content without influencing the microstructure. Finally, these electrolytes with different contents of MPS were used in the Damascene via filling. The results showed that when the content of MPS was 40 ppm, the Damascus via was completely filled without voids. The achievement of via filling with nanotwinned copper makes the application of nanotwinned copper possible in Integrated Circuit (IC) fabrication, which also greatly promotes the development of interconnected material for next generation.

Keywords

pulse electroplating / nanotwinned copper / via filling / Damascene process

Cite this article

Download citation ▾
Yu-Xi Wang, Li-Yin Gao, Yong-Qiang Wan, Zhe Li, Zhi-Quan Liu. Pulse Electroplating of Nanotwinned Copper Using MPS-PEG Two-Additive System for Damascene via Filling Process. Journal of Electrochemistry, 2023, 29(8): 2209231 DOI:10.13208/j.electrochem.2209231

登录浏览全文

4963

注册一个新账户 忘记密码

References

[1]

Cho D H, Seo S M, Kim J B, Rajendran S H, Jung J P. A review on the fabrication and reliability of three-dimensional integration technologies for microelectronic packaging: Through-Si-Via and solder bumping process[J]. Metals, 2021, 11(10): 1664.

[2]

Tu K N. Reliability challenges in 3D IC packaging technology[J]. Microelectron. Reliab., 2011, 51(3): 517-523.

[3]

Shen Y, Li B B, Ma Y, Wang Z L. Research progress in electroless cobalt plating and the bottom-up filling of electroless plating[J]. J. Electrochem., 2022, 28(7): 2213002.

[4]

Tan B Z, Liang J L, Lai Z L, Luo J Y. Electrochemical deposition of copper pillar bumps with high uniformity[J]. J. Electrochem., 2022, 28(7): 2213004.

[5]

Lu L, Shen Y F, Chen X H, Qian L H, Lu K. Ultrahigh strength and high electrical conductivity in copper[J]. Science, 2004, 304(5669): 422-426.

[6]

Tseng C H, Tu K N, Chen C. Comparison of oxidation in uni-directionally and randomly oriented cu films for low temperature Cu-to-Cu direct bonding[J]. Sci. Rep., 2018, 8(1): 1-7.

[7]

Sun F L, Liu Z Q, Li C F, Zhu Q S, Zhang H, Suganuma K. Bottom-up electrodeposition of large-scale nanotwinned copper within 3D through silicon via[J]. Materials, 2018, 11(2): 319.

[8]

Huang J, Gao L Y, Peng Z J, Li Z, Liu Z Q, Sun R. Effect of sodium thiazolinyl dithiopropane sulphonate (SH110) addition on electroplating nanotwinned copper films and their filling performance of fine-pitch redistributed layer (RDL)[J]. Nanotechnology, 2023, 34(1): 015710.

[9]

Dong M Y, Chen P X, Hang T, Li M. Nanotwinned copper micro-cone array fabricated by pulse electrodeposition for low-temperature bonding - sciencedirect[J]. Materials Letters, 290: 129470.

[10]

Bai Y, Hu H, Ling H Q, Hang T, Hu A M, Wu Y M, Li M. Communication—fabrication of vertical nanotwinned copper with (220) texture by direct current electrodeposition[J]. J. Electrochem. Soc., 2021, 168(8): 082506.

[11]

Li Y J, Tu K N, Chen C. Tensile properties and thermal stability of unidirectionally< 111>-oriented nanotwinned and< 110>-oriented microtwinned copper[J]. Materials, 2020, 13(5): 1211.

[12]

Zhu Q S, Zhang X, Li S J, Liu C Z, Li C F. Communication—electrodeposition of nano-twinned Cu in void-free filling for blind microvia of high density interconnect[J]. J. Electrochem. Soc., 2019, 166(1): D3097-D3099.

[13]

Zhan X F, Lian J, Li H J, Wang X B, Zhou J A, Trieu K, Zhang X P. Preparation of highly (111) textured nanotwinned copper by medium-frequency pulsed electrodeposition in an additive-free electrolyte[J]. Electrochim. Acta, 2020, 365: 137391.

[14]

Hai N T M, Huynh T T M, Fluegel A, Arnold M, Mayer D, Reckien W, Bredow T, Broekmann P. Competitive anion/anion interactions on copper surfaces relevant for damascene electroplating[J]. Electrochim. Acta, 2012, 70: 286-295.

[15]

Zhang Y B, Gao L Y, Li X, Li Z, Ma X L, Liu Z Q, Sun R. Electroplating nanotwinned copper for ultrafine pitch redistribution Layer (RDL) of advanced packaging technology. In: 2021 22nd International Conference on Electronic Packaging Technology (ICEPT): IEEE, 2021. 1-6.

[16]

Du L, Shi T L, Su L, Xue D M, Liao G L. A novel bottom-up copper filling of blind silicon vias in 3d electronic packaging[J]. J. Micromech. Microeng., 2015, 25(4): 045005.

[17]

Zhou Z H, Tan C L, Xiong W, Xi D L, Liu B Y. Introduction of development and application technology of organic additives for acid copper electroplating[J]. J. Electrochem., 2022, 28(6): 2104531.

[18]

Meng Y C, Zhou M M, Huang W, Min Y L, Shen X X, Xu Q J. Benzyl-containing quaternary ammonium salt as a new leveler for microvia copper electroplating[J]. Electrochim. Acta, 2022, 429: 141013.

[19]

Zhou M M, Meng Y C, Ling J W, Zhang Y, Huang W, Min Y L, Shen X X, Xu Q J. 5-Amino-1,3,4-Thiadiazole-2-Thiol as a new leveler for blind holes copper electroplating: Theoretical calculation and electrochemical studies[J]. Applied Surface Science, 2022, 606: 154871.

[20]

Chen Q W, Wang Z Y, Cai J, Liu L T. The influence of ultrasonic agitation on copper electroplating of blind-vias for soi three-dimensional integration[J]. Microelectron. Eng., 2010, 87(3): 527-531.

[21]

Tao Z H, Long Z Y, Tengxu L J, Liu G T, Tao X F. The synergistic effects of additives on the micro vias copper filling[J]. J. Electroanal. Chem., 2022: 116456.

[22]

Huang J, Gao L Y, Liu Z Q. The electrochemical behavior of leveler JGB during electroplating of nanotwinned copper[C]// 2020 21st International Conference on Electronic Packaging Technology (ICEPT):IEEE, 2020: 1-4.

[23]

Sun F L, Gao L Y, Liu Z Q, Zhang H, Sugahara T, Nagao S, Suganuma K. Electrodeposition and growth mechanism of preferentially orientated nanotwinned Cu on silicon wafer substrate[J]. J. Mater. Sci. Technol., 2018, 34(10): 1885-1890.

[24]

Li Z G, Gao L Y, Li Z, Sun R, Liu Z Q. Regulating the orientation and distribution of nanotwins by trace of gelatin during direct current electroplating copper on titanium substrate[J]. J. Mater. Sci., 2022, 57(37): 17797-17811.

[25]

Wang Y X, Gao L Y, Wan Y Q, Liu Z Q, Sun R. Effect of pulse off time on microstructure and properties of twinned copper films by pulse electrodeposition[C]// . 2022 23rd International Conference on Electronic Packaging Technology (ICEPT), Dalian, China, 2022: 1-5.

[26]

Chan T C, Lin Y M, Tsai H W, Wang Z M, Liao C N, Chueh Y L. Growth of large-scale nanotwinned Cu nanowire arrays from anodic aluminum oxide membrane by electrochemical deposition process: Controllable nanotwin density and growth orientation with enhanced electrical endurance performance[J]. Nanoscale, 2014, 6(13): 7332-7338.

[27]

Hsiao H Y, Liu C M, Lin H W, Liu T C, Lu C L, Huang Y S, Chen C, Tu K N. Unidirectional growth of microbumps on (111)-oriented and nanotwinned copper[J]. Science, 2012, 336(6084): 1007-1010.

[28]

Pavithra C L P, Sarada B V, Rajulapati K V, Ramakrishna M, Gundakaram R C, Rao T N, Sundararajan G. controllable crystallographic texture in copper foils exhibiting enhanced mechanical and electrical properties by pulse reverse electrodeposition[J]. Cryst. Growth Des., 2015, 15(9): 4448-4458.

[29]

Xu D, Kwan W L, Chen K, Zhang X, Ozolins V, Tu K N. Nanotwin formation in copper thin films by stress/strain relaxation in pulse electrodeposition[J]. Appl. Phys. Lett., 2007, 91(25): 254105.

[30]

Marro J B, Darroudi T, Okoro C A, Obeng Y S, Richardson K C. The influence of pulse plating frequency and duty cycle on the microstructure and stress state of electroplated copper films[J]. Thin Solid Films, 2017, 621: 91-97.

[31]

Wang C, Zhang J Q, Yang P X, An M Z. Through-hole filling by copper electroplating using sodium thiazolinyl-dithiopropane sulfonate as the single additive[J]. Int. J. Electrochem. Sci., 2012, 7(11): 10644-10651.

[32]

Hong B, Jiang C H, Wang X J. Influence of complexing agents on texture formation of electrodeposited copper[J]. Surf. Coat Technol., 2007, 201(16-17): 7449-7452.

AI Summary AI Mindmap
PDF (3782KB)

178

Accesses

0

Citation

Detail

Sections
Recommended

AI思维导图

/