Relationship between basic dental polymethyl methacrylate polymer roughness and surface topography and microbial biofilm formation using different polishing techniques
S D Arutyunov , E V Ippolitov , A A Pivovarov , V N Tsarev
Kazan medical journal ›› 2014, Vol. 95 ›› Issue (2) : 224 -231.
Relationship between basic dental polymethyl methacrylate polymer roughness and surface topography and microbial biofilm formation using different polishing techniques
Aim. To determine the relationship between surface roughness and surface topography of the basic dental polymethyl methacrylate polymer polished by different methods and microbial adhesion of microorganisms (Porphyromonas gingivalis, Fusobacterium nucleatum and Streptococcus sanguis) and fungi (Candida albicans) causing periodontal diseases. Methods. Surface topography of the basic dental polymethyl methacrylate polymer was studied by atomic force microscopy; microbiological methods were used to study the adhesion of bacteria and Candida fungi causing periodontal diseases to the surfaces of the samples polished by different methods. Results. It was shown that Streptococcus sanguis had the highest adhesion degree to the polymer surface after milling, Porphyromonas gingivalis and Candida albicans had moderate, and Fusobacterium nucleatum - low adhesion degree. The adhesion dropped significantly after the sample had been polished in dental laboratory or using the «Ergo Boxing» compared to dental unit polishing, where the decrease was less significant. The article contains 2D- and 3D-atomic force microscopy pictures of polymer surface after different polishing methods use. Images obtained by atomic force microscopy clearly display the surface of the basic dental polymethyl methacrylate polymer polished by different methods. Conclusion. Polymer samples processed by «Ergo Boxing» and dental laboratories are characterized by minimal microbial adhesion when compared with other methods.
polymethyl methacrylate / microbial adhesion / strains causing periodontal diseases / Candida fungi / atomic force microscopy
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Arutyunov S.D., Ippolitov E.V., Pivovarov A.A., Tsarev V.N.
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