A non-polarization short-wave-pass thin film edge filter

Abstract

Multilayer dielectric thin film edge filter has serious polarization sensitivity under oblique incidence. The cutoff-bands of the s-polarization and p-polarization light in conventional edge filter will separate obviously under 45° oblique incidence, which limits its application. Based on the two chosen materials TiO₂ and SiO₂, a novel stack structure is proposed to design the non-polarization short-wave-pass thin film edge filter. By using the (4H 4L 4H) as the matching layers, the polarization separation at 3 dB transmittance for the thin film edge filter cutoff-band is less than 1 nm at the incident angle of 45°. In this way, the non-polarization short-wave-pass edge filter is easily designed and fabricated.

Keywords

Oblique Incidence / Transmittance Curve / Polarization Sensitivity / Dense Wavelength Division Multiplex / Edge Filter

References

[1] Domash L, Wu M, Nemchuk N. J. Lightw. Technol.. 2004, 22: 126

[2] Antonio J E, Castillo A, May D A. Opt. Lett.. 2010, 35: 324

[3] Yu K, Huang D X, Bao J Q. Journal of Optoelectronics·Laser. 2013, 24: 459

[4] Wang C, Luo B, Pan W. Acta Optica Sinica. 2005, 25: 707

[5] Yu K, Liu Y Y, Bao J Q, Huang D X. Optics and Laser Technology. 2014, 56: 71

[6] Qi H, Hong R J, He H B, Shao J D, Fan Z X. Sci. China E: Eng. Mater.. 2005, 48: 61

[7] Gu P F, Chen H X, Li H F, Liu X. Appl. Opt.. 2004, 43: 2066

[8] Yu K, Yin J J, Huang D X, Bao J Q. Optik. 2014, 125: 397

[9] Thelen A. J. Opt. Soc. Am.. 1981, 71: 309

[10] Yu K, Liu W, Huang D X, Chang J. Opt. Commun.. 2008, 281: 3709

[11] Fu C F. Optoelectronics Letters. 2010, 6: 37