A method for determining the complex refractive index dispersion of absorbing materials without thickness information

Zhichao Deng , Jianchun Mei , Jin Wang , Qing Ye , Jianguo Tian

Optoelectronics Letters ›› : 676 -680.

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Optoelectronics Letters ›› : 676 -680. DOI: 10.1007/s11801-024-3259-2
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A method for determining the complex refractive index dispersion of absorbing materials without thickness information

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Abstract

The complex refractive index dispersion (CRID) of absorbing materials is very important in many fields, especially in printing industry and medical research. However, due to their strong absorbing, CRID determination is still a challenge. In this study, without diluting treatment or the thickness information, a method is proposed to calculate the CRID of absorbing materials, based merely on the reflectance and transmittance spectra measurements. The method separates the CRID into absorbing part and transparent part based on Kramers-Kronig relations, and it also uses the common Cauchy dispersion formula and Fresnel reflection formula. The CRID of methyl-red-doped poly (methyl methacrylate) (MR-PMMA) (3% mass fraction) and hemoglobin (Hb) solutions (320 g/L) are determined over the spectral range from 400 nm to 750 nm, and the result shows good stability and consistency of the method.

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Zhichao Deng, Jianchun Mei, Jin Wang, Qing Ye, Jianguo Tian. A method for determining the complex refractive index dispersion of absorbing materials without thickness information. Optoelectronics Letters 676-680 DOI:10.1007/s11801-024-3259-2

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