Tighter bounds of multihop relayed communications in Nakagami-m fading

Lianhai WU, Jiaru LIN, Kai NIU, Zhiqiang HE

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PDF(231 KB)
Front. Electr. Electron. Eng. ›› 2010, Vol. 5 ›› Issue (4) : 470-474. DOI: 10.1007/s11460-010-0117-8
RESEARCH ARTICLE
RESEARCH ARTICLE

Tighter bounds of multihop relayed communications in Nakagami-m fading

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Abstract

Closed-form bounds for the end-to-end perform-ance of multihop communications with non-regenerative relays over Nakagami-m fading channels are investigated. Upper and lower bounds of the end-to-end signal-to-noise ratio (SNR) are first developed by using the monotonicity. Then, the probability density functions (PDFs), the cumulative€ distribution€ functions, €and€ the€ moment-generating functions (MGFs) of the bounds are derived. Using these results, the bounds for the outage and average bit error probability (ABEP) are obtained. Numerical and simulation results are executed to validate the tightness of the proposed bounds.

Keywords

average bit error probability (ABEP) / multihop relayed communications / Nakagami-m fading / outage probability

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Lianhai WU, Jiaru LIN, Kai NIU, Zhiqiang HE. Tighter bounds of multihop relayed communications in Nakagami-m fading. Front Elect Electr Eng Chin, 2010, 5(4): 470‒474 https://doi.org/10.1007/s11460-010-0117-8

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Acknowledgements

This work was supported by the National Basic Research Program of China (Nos. 2007CB310604 and 2009CB320401) and the National Natural Science Foundation of China (Grant No. 60772108).

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2014 Higher Education Press and Springer-Verlag Berlin Heidelberg
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