Piezoresistive properties of resonant tunneling diodes

MAO Haiyang, XIONG Jijun, ZHANG Wendong, XUE Chenyang, SANG Shengbo, BAO Aida

PDF(430 KB)
PDF(430 KB)
Front. Electr. Electron. Eng. ›› 2007, Vol. 2 ›› Issue (4) : 449-453. DOI: 10.1007/s11460-007-0084-x

Piezoresistive properties of resonant tunneling diodes

  • MAO Haiyang, XIONG Jijun, ZHANG Wendong, XUE Chenyang, SANG Shengbo, BAO Aida
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Abstract

A measurement system was designed and established to test the piezoresistive properties of resonant tunneling diodes (RTDs). The current-voltage characteristic shifts of RTD at different stress states were detected. The experimental results demonstrate that the piezoresistive sensitivity of RTD is larger than 1×10-8 Pa-1. To accurately represent the piezoresistive properties of RTD, the current-voltage characteristic coherence of the same RTD was tested. According to the experimental results, the largest relative resistance shift of an RTD in the same measurement environment is less than 3%, of which 1% is caused by the testing apparatuses.

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MAO Haiyang, XIONG Jijun, ZHANG Wendong, XUE Chenyang, SANG Shengbo, BAO Aida. Piezoresistive properties of resonant tunneling diodes. Front. Electr. Electron. Eng., 2007, 2(4): 449‒453 https://doi.org/10.1007/s11460-007-0084-x
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