Comprehensive evaluation factor of optoelectronic properties for transparent conductive metallic mesh films

Abstract

Finding the optimal optoelectronic properties (zero-order optical transmittance, shielding effectiveness, and stray light uniformity) of metallic mesh is significant for its application in electromagnetic interference shielding areas. However, there are few relevant studies at present. Based on optoelectronic properties, we propose a comprehensive evaluation factor Q, which is simple in form and can be used to evaluate the mesh with different parameters in a simple and efficient way. The effectivity of Q is verified by comparing the trend of Q values with the evaluation results of the technique for order preference by similarity to ideal solution (TOPSIS). The evaluation factor Q can also be extended to evaluate the optoelectronic properties of different kinds of metallic meshes, which makes it extremely favorable for metallic mesh design and application.

Keywords

Metallic mesh / Technique for order preference by similarity to ideal solution (TOPSIS) / Entropy weight (EW) / Comprehensive evaluation / Transparent conductive films

RIGHTS & PERMISSIONS

2021 Zhejiang University Press