Wheat ear growth modeling based on a polygon

Abstract

Visual inspection of wheat growth has been a useful tool for understanding and implementing agricultural techniques and a way to accurately predict the growth status of wheat yields for economists and policy decision makers. In this paper, we present a polygonal approach for modeling the growth process of wheat ears. The grain, lemma, and palea of wheat ears are represented as editable polygonal models, which can be re-polygonized to detect collision during the growth process. We then rotate and move the colliding grain to resolve the collision problem. A linear interpolation and a spherical interpolation are developed to simulate the growth of wheat grain, performed in the process of heading and growth of wheat grain. Experimental results show that the method has a good modeling effect and can realize the modeling of wheat ears at different growth stages.

Keywords

Visual inspection / Virtual crop / Three-dimensional modeling

RIGHTS & PERMISSIONS

2019 Zhejiang University and Springer-Verlag GmbH Germany, part of Springer Nature