利用对称结构和结合差分进化的文化算法检测阵列中的故障传感器

Shafqat Ullah KHAN, Ijaz Mansoor QURESHI, Fawad ZAMAN, Wasim KHAN

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PDF(1293 KB)
Front. Inform. Technol. Electron. Eng ›› 2017, Vol. 18 ›› Issue (2) : 235-245. DOI: 10.1631/FITEE.1500315
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Article

利用对称结构和结合差分进化的文化算法检测阵列中的故障传感器

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Abstract

本文解决了从N个传感器组成的线性阵列中检测完全或部分缺陷传感器的问题。本文首先提出了一种线性阵列的对称结构,其次,基于结合差分进化的文化算法,建立了一种混合技术。对称结构具有两个优点:(1)不需要找到所有损坏的模式,仅需找到(N–1)/2个必需模式;(2)不需要扫描0°到180°区域,仅需扫描0°到90°区域。显然,这样可以减少计算的复杂度。通过Monte Carlo模拟对该方案性能进行了验证,并在计算时间和均方误差方面与现有方法进行了比较。

Keywords

文化算法 / 差分进化 / 线性对称传感器阵列

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Shafqat Ullah KHAN, Ijaz Mansoor QURESHI, Fawad ZAMAN, Wasim KHAN. 利用对称结构和结合差分进化的文化算法检测阵列中的故障传感器. Front. Inform. Technol. Electron. Eng, 2017, 18(2): 235‒245 https://doi.org/10.1631/FITEE.1500315

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