CdualTAL: multi-domain tool wear prediction using a dual-channel Transformer and cross-attention network

Na LI , Zhendong LIU , Xiao WANG , Jiamin JIANG , Yanjie WEI

Eng Inform Technol Electron Eng ›› 2026, Vol. 27 ›› Issue (2) : 250111

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Eng Inform Technol Electron Eng ›› 2026, Vol. 27 ›› Issue (2) :250111 DOI: 10.1631/ENG.ITEE.2025.0111
Research Article
CdualTAL: multi-domain tool wear prediction using a dual-channel Transformer and cross-attention network
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Abstract

Accurate tool wear prediction is crucial for manufacturing efficiency, yet effectively using multi-domain sensor features is difficult due to redundant noise. There is a critical need to strategically leverage highly predictive strong features and potentially informative weak features. To address this issue, we propose CdualTAL, an improved Transformer-based encoder-attention-decoder algorithm. Its name represents the model’s key components: a correlation-adaptive feature selection algorithm module, a dual-channel Transformer encoder, an attention mechanism, and a long short-term memory (LSTM) decoder. CdualTAL employs a dual-channel encoder to independently process the full set of multi-domain features, along with a subset of strong features selected using a designed correlation-adaptive feature selection algorithm. A custom cross-attention mechanism is then used to fuse these representations, sharpening focus on strong features while judiciously integrating information from weak ones. Finally, a hierarchical LSTM decoder captures deep temporal dependencies. Validated on tool wear datasets, CdualTAL outperforms 11 state-of-the-art methods, achieving superior prediction stability and accuracy with an average R2 of 0.983 and a root mean square error (RMSE) of 4.373.

Keywords

Multi-domain features / Dual-channel / Feature fusion / Tool wear / Attention mechanism / Feature enhancement

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Na LI, Zhendong LIU, Xiao WANG, Jiamin JIANG, Yanjie WEI. CdualTAL: multi-domain tool wear prediction using a dual-channel Transformer and cross-attention network. Eng Inform Technol Electron Eng, 2026, 27 (2) : 250111 DOI:10.1631/ENG.ITEE.2025.0111

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