TY - Front. Electr. Electron. Eng. A1 - WANG Junping, HAO Yue, LI Kang, FANG Jianping, ZHANG Zhuokui, REN Chunli T1 - Yield modeling of elliptical defect Y1 - 2007-03-05 JF - Frontiers of Electrical and Electronic Engineering JO - Front. Electr. Electron. Eng. SP - 108 EP - 111 VL - 2 IS - 1 UR - https://journal.hep.com.cn/fee N1 - 10.1007/s11460-007-0020-0 ER -