RT Journal T1 Development and prospect of near-field optical measurements and characterizations A1 Jia WANG, Qingyan WANG, Mingqian ZHANG PB Front. Optoelectron. FD 2012-06-05 YR 2012 JF Frontiers of Optoelectronics JO Front. Optoelectron. VO 5 IS 2 SP 171 DO 10.1007/s12200-012-0257-y K1 scanning near-field optical microscopy (SNOM);near-field optical (NFO) measurement;super-resolution imaging;near-field spectroscopy;nano-optics;nanophotonics LK {https://journal.hep.com.cn/foe/EN/article/article_3890.shtml}