Versionized process based on non-volatile random-access memory for fine-grained fault tolerance

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Front. Inform. Technol. Electron. Eng ›› 2018, Vol. 19 ›› Issue (2) : 192-205. DOI: 10.1631/FITEE.1601477
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Versionized process based on non-volatile random-access memory for fine-grained fault tolerance

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{{article.zuoZheEn_L}}. {{article.titleEn}}. Front. Inform. Technol. Electron. Eng, 2018, 19(2): 192‒205 https://doi.org/10.1631/FITEE.1601477

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