An efficient bi-objective optimization framework for statistical chip-level yield analysis under parameter variations

{{article.zuoZheEn}}

PDF(601 KB)
PDF(601 KB)
Front. Inform. Technol. Electron. Eng ›› 2016, Vol. 17 ›› Issue (2) : 160-172.

An efficient bi-objective optimization framework for statistical chip-level yield analysis under parameter variations

  • {{article.zuoZheEn}}
Author information +
History +

Highlights

{{article.highlightEn}}

Abstract

{{article.abstractEn}}

Author summary

{{article.authorSummayEn}}

Keywords

Cite this article

EndNote

Ris (Procite)

Bibtex

Download citation ▾
{{article.zuoZheEn_L}}. {{article.titleEn}}. Front. Inform. Technol. Electron. Eng, 2016, 17(2): 160‒172

References

Publishing order | Descend order by publishing year | Descend order by cited within

References

{{article.reference}}

RIGHTS & PERMISSIONS

{{article.copyright.year}} {{article.copyright.holder}}
PDF(601 KB)

Accesses

Citations

Detail
Sections
Recommended

/

〈 〉